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题名/责任者:

Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 / IEEE Computer Society Test Technology Committee.

出版发行项:

Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1983.

ISBN:

0818645202 (microfiche)

ISBN:

0818685204 (casebound)

ISBN:

0818605200 (pbk.) :

载体形态项:

vii, 173 p. : ill. ; 28 cm.

会议名称:

Curriculum for Test Technology Workshop (1983 : University of Minnesota, Minneapolis)

附加团体名称:

IEEE Computer Society. Test Technology Committee.

附加团体名称:

IEEE Computer Society.

论题主题:

Integrated circuits-Testing-Congresses.

论题主题:

Integrated circuits-Testing-Study and teaching-Congresses.

中图法分类号:

TP274-53

一般附注:

"IEEE catalog number 83CH1978-6."

一般附注:

"IEEE Computer Society order number 520."

一般附注:

Proceedings of the Curriculum for Test Technology Workshop.

一般附注:

"[Sponsored by] the Institute of Electrical and Electronics Engineers, Inc., IEEE Computer Society."

书目附注:

Includes bibliographical references and index.

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