MARC状态：已编 文献类型：西文图书 浏览次数：60
- 题名/责任者:
- Scanning electron microscopy 1978 / edited by Om Johari.
- 出版发行项:
- Chicago : Scanning Electron Microscopy, Inc., 1978.
- 载体形态项:
- 2 v. : ill. ; 29 cm.
- 附加个人名称:
- Johari, Om.
- 中图法分类号:
- TN153-53
- 书目附注:
- Includes bibliographies.
- 内容附注:
- v. 1. An international review of advances in instrumentation, techniques, theory and physical applications of thescanningelectron microscope. -- 898 p. -- v. 2. An international review of advances in biological techniques andapplications of thescanning electron microscope / edited by Om Johari and Robert P. Becker. -- 1134 p.
- 随书光盘:
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| 索书号 | 条码号 | 年卷期 | 馆藏地 | 书刊状态 |
| TN153-53/JO/(1978) | 137464 | v |  西区4层
|
可借 |
| TN153-53/JO/(1978) | 137468 | 东5层4区
|
可借 |
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