MARC状态：已编 文献类型：西文图书 浏览次数：60
- 题名/责任者:
- Meeting the tests of time : International Test Conference 1989 proceedings : August 29-31, 1989 : Sheraton Washington Hotel, Washington, DC / sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.
- 出版发行项:
- Washington : IEEE Computer Society Press , c1989.
- ISBN:
- 0818659629
- ISBN:
- 0818689625 :
- 载体形态项:
- xxxiv, 959 p. : ill. ; 29 cm.
- 会议名称:
- International Test Conference (20th : 1989 : Washington, DC)
- 附加团体名称:
- IEEE Computer Society. Test Technology Technical Committee.
- 附加团体名称:
- IEEE Computer Society. Philadelphia Chapter.
- 论题主题:
- Integrated circuits-Testing-Congresses.
- 论题主题:
- Automatic checkout equipment-Congresses.
- 中图法分类号:
- TN407-53
- 书目附注:
- Includes bibliographical references and index.
- 随书光盘:
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| 索书号 | 条码号 | 年卷期 | 馆藏地 | 书刊状态 |
| TN407-53/ITC/(1989) | E0274564 | 1989 |  东5层4区
|
可借 |
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