MARC状态：已编 文献类型：西文图书 浏览次数：63
- 题名/责任者:
- Upset susceptibility study employing circuit analysis and digital simulation / Victor A. Carreno.
- 出版发行项:
- [Hampton, Va.] : National Aeronautics and Space Administration, Langley Research Center, 1984.
- 载体形态项:
- 22 p. : ill. ; 26 cm.
- 丛编说明:
- NASA Technical Memorandum ; 85822
- 个人责任者:
- Carreno, Victor A., 1956-
- 附加团体名称:
- United States. National Aeronautics and Space Administration. Langley Research Center.
- 论题主题:
- Architecture (Computers)
- 论题主题:
- Transients (Electricity)
- 中图法分类号:
- TM133
- 一般附注:
- "June 1984."
- 书目附注:
- Includes bibliographical references (p. 10)
- 随书光盘:
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