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题名/责任者:

Microelectronics and reliability.

出版发行项:

Oxford ; New York : Pergamon Press, c1964-

ISSN:

0026-2714

载体形态项:

v. : ill. ; 26-27cm.

起止卷期:

Vol 3, no. 1 (June 1964)-

先前出版物:

Electronics reliability & microminiaturization

论题主题:

Miniature electronic equipment-Periodicals.

论题主题:

Electronic apparatus and appliances-Reliability-Periodicals.

中图法分类号:

TN4

出版周期:

15 no. a year, <Jan. 1993->

先前出版周期:

Quarterly, 1964-1969

先前出版周期:

Bimonthly, 1970-

一般附注:

Title from cover.

引文/参考附注:

ISMEC bulletin 0306-0039

引文/参考附注:

International aerospace abstracts 0020-5842

引文/参考附注:

Excerpta medica

引文/参考附注:

Engineering index monthly (1984) 0742-1974

引文/参考附注:

Engineering index energy abstracts 0093-8408

引文/参考附注:

Engineering index bioengineering abstracts 0736-6213

引文/参考附注:

Engineering index annual (1968) 0360-8557

引文/参考附注:

Electronics and communications abstracts journal (Riverdale) 0361-3313

引文/参考附注:

Chemical abstracts 0009-2258

引文/参考附注:

Physics abstracts 0036-8091 1968-

引文/参考附注:

Electrical & electronics abstracts 0036-8105 1968-

引文/参考附注:

Computer & control abstracts 0036-8113 1968-

引文/参考附注:

Safety science abstracts journal 0160-1342

引文/参考附注:

Pollution abstracts with indexes 0032-3624

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