MARC状态：已编 文献类型：西文图书 浏览次数：53
- 题名/责任者:
- Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980 / sponsored by IEEE Computer Society, Test Technology Committee [and] Philadelphia Section of the IEEE.
- 出版发行项:
- New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, c1980.
- 载体形态项:
- xv, 507 p. : ill. ; 28 cm.
- 会议名称:
- Test Conference (11th : 1980 : Philadelphia, Pa.)
- 附加团体名称:
- Institute of Electrical and Electronics Engineers. Philadelphia Section.
- 附加团体名称:
- IEEE Computer Society. Test Technology Committee.
- 论题主题:
- Integrated circuits-Testing-Congresses.
- 中图法分类号:
- TM93-53
- 一般附注:
- "80CH1608-9."
- 书目附注:
- Includes bibliographical references and index.
- 随书光盘:
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| 索书号 | 条码号 | 年卷期 | 馆藏地 | 书刊状态 |
| TM93-53/TC/(1980) | E0274749 | 1980 |  东5层4区
|
可借 |
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