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西文图书1.Autotestcon '89 : conference record : IEEE International Automatic Testing Conference / TP274-53/AN/(1989)
馆藏复本:1
可借复本:0 sponsored by the Institute of Electrical and Electronics Engineers ... [et al.].
IEEE, c1989.
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西文图书2.Autotestcon '84 : proceedings, 5-7 Nov., 1984, Sheraton-Washington Hotel, Washington, DC. TP274-53/AN/(1984)
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可借复本:1 Autotestcon'84
IEEE, c1984.
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西文图书3.Proceedings : Autotestcon '85, Long Island, N.Y., October 22-24, 1985, IEEE International Automatic TP274-53/AN/(1985)
馆藏复本:1
可借复本:1 sponsored by the Institute of Electrical and Electronic Engineers ... [et al.].
IEEE ; c1985.
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西文图书4.Autotestcon '82 : 1982 IEEE International Automatic Testing Conference, October 12-14, Dayton Conven TP274-53/AN/(1982)
馆藏复本:1
可借复本:1 sponsored by the Institute of Electrical and Electronic Engineers ... [et al.].
IEEE, c1982.
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西文图书5.Proceedings : Autotestcon 86, San Antonio, TX, September 8-11, 1986, IEEE International Automatic Te TP274-53/AN/(1986)
馆藏复本:2
可借复本:2 sponsored by the Institute of Electrical and Electronics Engineers ... [et al.].
IEEE ; c1986.
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西文图书6.Autotestcon '83 : November 1,2,3, Hyatt Regency, Tarrant County Convention Center, Fort Worth, Texas TP274-53/AN/(1983)
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可借复本:1 sponsored by IEEE ... [et. al.]. ; Participating Society, AIAA Support System, IEEE Reliability soc
Institute of Electrical and Electronics Engineers , c1983.
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西文图书7.Autotestcon '88 : symposium proceedings : futuretest : October 4-6, 1988, IEEE International Automat TP274-53/AN/(1988)
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可借复本:1 sponsored by the Institute of Electrical and Electronics Engineers ... [et al.] ; participating soci
IEEE, c1988.
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