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西文图书1.Autotestcon '89 : conference record : IEEE International Automatic Testing Conference / TP274-53/AN/(1989)
馆藏复本:1
可借复本:0 sponsored by the Institute of Electrical and Electronics Engineers ... [et al.].
IEEE, c1989.
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馆藏复本:1
可借复本:0 sponsored by the Institute of Electrical and Electronics Engineers ... [et al.].
IEEE, c1989.
(0) 馆藏