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检索到 2 条 责任者=International Test Conference 的结果    

 


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  1. 西文图书1.International Test Conference : proceedings : the three faces of test : design, characterization,... TB22-53/ITC

    馆藏复本：1
    可借复本：0     sponsored by the IEEE Computer Society Test Technology Committee, IEEE Philadelphia Section.
    IEEE Computer Society Pr., c1984.
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  2. 西文图书2.Meeting the tests of time : International Test Conference 1989 proceedings : August 29-31, 1989 : Sh TN407-53/ITC/(1989)

    馆藏复本：1
    可借复本：1     sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Sec
    IEEE Computer Society Press , c1989.
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