检索到 8 条 责任者=NETWORK (Organization). 的结果
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西文图书1.Automatic testing 81 & test instrumentaion. Session 3, General applications and ate philosophy / TP274-53/MCC/V.3
馆藏复本：1
可借复本：1 supported by the IERE, the IQA, the Society of Test Engineers and the Journals TEST and NEW ELECTRON
Network, c1981.
(0) 馆藏 -
西文图书2.Automatic testing 81 & test instrumentation : Metropole Converntion Centre, Brighton, England, 7-10 TP274-53/MCC/(1981)/V.2
馆藏复本：1
可借复本：1 supported by the IERE, the IQA, the Society of Test Engineers and the Journals TEST and NEW ELECTRON
Network, c1981.
(0) 馆藏 -
西文图书3.Automatic testing 80 : proceedings of AUTOMATIC TESTING '80 Conference, 23-25 September 1980. Future TP274-53/ATP/V.3
馆藏复本：1
可借复本：1 supported by the IERE, the IQA, the IEE, the Society of Test Engineers and the Journals TEST and NEW
Network, 1980.
(0) 馆藏 -
西文图书4.Automatic testing 81 & test instrumentaion : Metropole Convention Centre, Brighton, England, 7-10 De TP274-53/MCC/(1981)/V.1
馆藏复本：1
可借复本：1 supported by the IERE, the IQA, the Society of Test Engineers and the Journals TEST and NEW ELECTRON
Network, c1981.
(0) 馆藏 -
西文图书5.Automatic testing 81 & test instrumentation : Metropole Convention Centre, Brighton, England, 7-10 D TP274-53/MCC/(1981)/V.6
馆藏复本：1
可借复本：1 supported by the IERE, the IQA, the Society of Test Engineers and the Journals TEST and NEW ELECTRON
Network, c1981.
(0) 馆藏 -
西文图书6.Automatic testing 81 & test instrumentation : Metropole Convention Centre, Brighton, England, 7-10 D TP274-53/MCC/(1981)/V.7
馆藏复本：1
可借复本：1 supported by the IERE, the IQA, the Society of Test Engineers and the Journals TEST and NEW ELECTRON
Network, c1981.
(0) 馆藏 -
西文图书7.Automatic testing 80 : proceedings of AUTOMATIC TESTING '80 Conference, 23-25 September 1980. sessio TP274-53/MCC/(1980)/V.1
馆藏复本：1
可借复本：1 supported by the IERE, the IQA, the IEE, the Society of Test Engineers and the Journals TEST and NEW
Network, 1980.
(0) 馆藏 -
西文图书8.Automatic testing 81 & test instrumentation : Metropole Converntion Centre, Brighton, England, 7-10 TP274-53/MCC/(1981)/V.4
馆藏复本：1
可借复本：1 supported by the IERE, the IQA, the Society of Test Engineers and the Journals Test and New Electron
Network, c1981.
(0) 馆藏
