-
西文图书1.Automated inspection and measurement : 28-30 October 1986, Cambridge, Massachusetts / TP274-53/AIM
馆藏复本:1
可借复本:1 Michael J.W. Chen, Robert Thibadeau, chairs/editors ; sponsored by SPIE--the International Society f
SPIE--the International Society for Optical Engineering, c1987.
(0) 馆藏