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检索到 2 条 分类号=TB22-53 的结果    

 


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  1. 西文图书1.International Test Conference : proceedings : the three faces of test : design, characterization,... TB22-53/ITC

    馆藏复本：1
    可借复本：0     sponsored by the IEEE Computer Society Test Technology Committee, IEEE Philadelphia Section.
    IEEE Computer Society Pr., c1984.
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  2. 西文图书2.The accuracy of industrial measurement of length and diameter : proceedings of the conference held a TB22-53/CAI

    馆藏复本：1
    可借复本：1     Conference on the Accuracy of Industrial Measurement of Length and Diameter
    H.M. Stationery Office, 1963.
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