检索到 23 条 主题词=Automatic checkout equipment 的结果
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西文图书1.Autotestcon '89 : conference record : IEEE International Automatic Testing Conference / TP274-53/AN/(1989)
馆藏复本：1
可借复本：0 sponsored by the Institute of Electrical and Electronics Engineers ... [et al.].
IEEE, c1989.
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西文图书2.International Test Conference : proceedings : the three faces of test : design, characterization,... TB22-53/ITC
馆藏复本：1
可借复本：0 sponsored by the IEEE Computer Society Test Technology Committee, IEEE Philadelphia Section.
IEEE Computer Society Pr., c1984.
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西文图书3.Sensor handbook for automatic test, monitoring, diagnostic, and control systems applications to m... TP216/LPS
馆藏复本：1
可借复本：0 Paul S. Lederer ; sponsored by U.S. Army Material Command, CORADCOM/DRDCO-TCS.
U.S. Dept. of Commerce, National Bureau of Standards : 1981.
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西文图书4.Logic analyzers for microprocessors / TP368/KJ
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可借复本：1 John Kneen ; edited by Charles H. House.
Hayden Book Co., c1980.
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西文图书5.Automatic testing 81 & test instrumentaion. Session 3, General applications and ate philosophy / TP274-53/MCC/V.3
馆藏复本：1
可借复本：1 supported by the IERE, the IQA, the Society of Test Engineers and the Journals TEST and NEW ELECTRON
Network, c1981.
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西文图书6.Automatic testing 81 & test instrumentation : Metropole Converntion Centre, Brighton, England, 7-10 TP274-53/MCC/(1981)/V.2
馆藏复本：1
可借复本：1 supported by the IERE, the IQA, the Society of Test Engineers and the Journals TEST and NEW ELECTRON
Network, c1981.
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西文图书7.Autotestcon '84 : proceedings, 5-7 Nov., 1984, Sheraton-Washington Hotel, Washington, DC. TP274-53/AN/(1984)
馆藏复本：1
可借复本：1 Autotestcon'84
IEEE, c1984.
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西文图书8.Autotestcon '88 : symposium proceedings : futuretest : October 4-6, 1988, IEEE International Automat TP274-53/AN/(1988)
馆藏复本：1
可借复本：1 sponsored by the Institute of Electrical and Electronics Engineers ... [et al.] ; participating soci
IEEE, c1988.
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西文图书9.Proceedings : Autotestcon 86, San Antonio, TX, September 8-11, 1986, IEEE International Automatic Te TP274-53/AN/(1986)
馆藏复本：2
可借复本：2 sponsored by the Institute of Electrical and Electronics Engineers ... [et al.].
IEEE ; c1986.
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西文图书10.Proceedings : Autotestcon '85, Long Island, N.Y., October 22-24, 1985, IEEE International Automatic TP274-53/AN/(1985)
馆藏复本：1
可借复本：1 sponsored by the Institute of Electrical and Electronic Engineers ... [et al.].
IEEE ; c1985.
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西文图书11.Competent expert systems : a case study in fault diagnosis / TP18/KET
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可借复本：1 E T Keravnou & L. Johnson.
McGraw-Hill Book Company, c1986.
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西文图书12.Automatic testing 80 : proceedings of AUTOMATIC TESTING '80 Conference, 23-25 September 1980. Future TP274-53/ATP/V.3
馆藏复本：1
可借复本：1 supported by the IERE, the IQA, the IEE, the Society of Test Engineers and the Journals TEST and NEW
Network, 1980.
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西文图书13.Automatic testing 81 & test instrumentation : Metropole Converntion Centre, Brighton, England, 7-10 TP274-53/MCC/(1981)/V.4
馆藏复本：1
可借复本：1 supported by the IERE, the IQA, the Society of Test Engineers and the Journals Test and New Electron
Network, c1981.
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西文图书14.Automatic testing 81 & test instrumentation : Metropole Convention Centre, Brighton, England, 7-10 D TP274-53/MCC/(1981)/V.6
馆藏复本：1
可借复本：1 supported by the IERE, the IQA, the Society of Test Engineers and the Journals TEST and NEW ELECTRON
Network, c1981.
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西文图书15.Automatic testing 81 & test instrumentation : Metropole Convention Centre, Brighton, England, 7-10 D TP274-53/MCC/(1981)/V.7
馆藏复本：1
可借复本：1 supported by the IERE, the IQA, the Society of Test Engineers and the Journals TEST and NEW ELECTRON
Network, c1981.
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西文图书16.Automatic testing 80 : conference proceedings, this volume is one of three covering the proceedings TP274-53/MCC/(1980)/V.2
馆藏复本：1
可借复本：1 supported by the IERE, the IQA, the IEE, the Society of Test Engineers and the journals TEST and NEW
Network, c1980
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西文图书17.Automatic testing 80 : proceedings of AUTOMATIC TESTING '80 Conference, 23-25 September 1980. sessio TP274-53/MCC/(1980)/V.1
馆藏复本：1
可借复本：1 supported by the IERE, the IQA, the IEE, the Society of Test Engineers and the Journals TEST and NEW
Network, 1980.
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西文图书18.Computer controlled testing and instrumentation : an introduction to the IEC-625:IEEE-488 bus / TP36/CM
馆藏复本：1
可借复本：1 Martin Colloms.
Pentech Pr., 1983.
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西文图书19.Autotestcon '82 : 1982 IEEE International Automatic Testing Conference, October 12-14, Dayton Conven TP274-53/AN/(1982)
馆藏复本：1
可借复本：1 sponsored by the Institute of Electrical and Electronic Engineers ... [et al.].
IEEE, c1982.
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西文图书20.Error detecting codes, self-checking circuits and applications / TP33/WJ
馆藏复本：1
可借复本：0 John Wakerly.
North-Holland, c1978.
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