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西文图书1.Electron and ion microscopy and microanalysis : principles and applications / TN153/MLE
馆藏复本:1
可借复本:0 Lawrence E. Murr.
Marcel Dekker, c1982.
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西文图书2.Electron microscopy and analysis, 1979 : proceedings of the Institute of Physics Electron Microscopy TN153-53/IPE/(1979)
馆藏复本:1
可借复本:1 edited by T. Mulvey.
Institute of Physics, 1980.
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