检索到 2 条 主题词=Test Facilities, Equipment and Methods. 的结果
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西文图书1.Testability of VLSI leakage faults in CMOS / TN47/MYK
馆藏复本：1
可借复本：1 Yashwant K.Malalya and Stephen Y.H.Su ; State University of New York at Binghamton.
Rome Air Development Center], 1983.
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西文图书2.High voltage testing : generator test procedure / TM83/HVT
馆藏复本：1
可借复本：1 performed by Boeing Aerospace Company; W.G.Dunbar.
Aero Propulsion Laboratory : 1982.
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