-
西文图书1.Design of testable logic circuits / TP331.1/BRG
馆藏复本:1
可借复本:1 R.G. Bennetts.
Addison-Wesley Pub. Co., c1984.
(0) 馆藏 -
西文图书2.Introduction to MOS LSI design / TN47/MJ
馆藏复本:1
可借复本:1 J. Mavor, M.A. Jack, P.B. Denyer.
Addison-Wesley, c1983.
(0) 馆藏