机读格式显示(MARC)

• 000 00988cam a2200301 a 4500

• 001 0000443240

• 005 20150119095100.0

• 008 071005s2008 enka b 001 0 eng

• 010 __ |a 2007041704

• 020 __ |a 9780470027844 (cloth)

• 020 __ |a 9780470027851 (paper) : |c CNY569.00

• 040 __ |a DLC |c DLC |d BTCTA |d BAKER |d YDXCP |d HUA |d SCT

• 050 00 |a TA417.23 |b .B73 2008

• 082 00 |a 620.1/1299 |2 22

• 090 __ |a TB303/BDG/(2)/ED-11

• 093 __ |a TB303 |2 4

• 099 __ |a CAL 022008112393

• 100 1_ |a Brandon, D. G.

• 245 10 |a Microstructural characterization of materials / |c David Brandon and Wayne D. Kaplan.

• 250 __ |a 2nd ed.

• 260 __ |a Chichester, England : |b John Wiley, |c c2008.

• 300 __ |a xiv, 536 p. : |b ill. (some col.) ; |c 25 cm.

• 490 0_ |a Quantitative software engineering series

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Materials |x Microscopy.

• 650 _0 |a Microstructure.

• 700 1_ |a Kaplan, Wayne D.

• 920 __ |a 211180 |z 2