机读格式显示(MARC)

• 000 00830cam a2200253 a 4500

• 001 0000570965

• 005 20191003122700.0

• 008 751229s1976 nyu b 00110 eng

• 010 __ |a 75045196 //r90

• 020 __ |a 0080196926

• 040 __ |a DLC |c DLC |d DLC

• 050 00 |a QD945 |b .T36 1976

• 090 __ |a O721/TBK

• 093 __ |a O721 |2 5

• 099 __ |a CAL 022000292191 |a CAL 022000332993

• 100 1_ |a Tanner, Brian Keith |0 CAL n2004341951# |7 ba0yba0y

• 245 10 |a X-ray diffraction topography / |c by B. K. Tanner.

• 260 __ |a New York : |b Pergamon Press, |c 1976.

• 300 __ |a xiii, 174 p. ; |c 26 cm.

• 490 0_ |a International series in the science of the solid state ; v. 10

• 490 0_ |a Pergamon international library

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a X-ray crystallography.

• 920 __ |a 211180 |z 1