机读格式显示(MARC)

• 000 01313cam 2200301 a 4500

• 000 1000103095

• 001 0000326085

• 005 20080414100620.0

• 008 960604c1983 nyua b 101 0 eng

• 020 __ |c CNY10.60

• 040 __ |a Tsinghua University Library |b eng |c TSU

• 090 __ |a TP274-53/AN/(1983)

• 093 __ |a TP274-53 |2 4

• 093 __ |a TP206 |2 4

• 099 __ |a CAL 021999654805 |a CAL 022000310211 |a CAL 022001118263

• 111 2_ |a Autotestcon '83 |d (1983 : |c Fort Worth, Tex.)

• 245 10 |a Autotestcon '83 : |b November 1,2,3, Hyatt Regency, Tarrant County Convention Center, Fort Worth, Texas / |c sponsored by IEEE ... [et. al.]. ; Participating Society, AIAA Support System, IEEE Reliability society.

• 260 __ |a New York, NY : |b Institute of Electrical and Electronics Engineers , |c c1983.

• 300 __ |a 477 p. : |b ill. ; |c 27 cm.

• 500 __ |a At head of title: New horizons in automatic testing.

• 500 __ |a "83CH1968-7."

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Automatic checkout equipment |v Congresses.

• 710 __ |a Institute of Electrical and Electronics Engineers.

• 901 __022008001789

• 905 __ |a CAU |f TP274-53/AN/(1983) |b E0273219

• 907 __ |a CAU |f TP274-53/AN/(1983) |b E0273219

• 999 __ |t C |A zjyx |a 20080414 10:01:41 |I zjyx |i 20080414 10:06:20 |G gxr |g 20100105 08:49:1