机读格式显示(MARC)

• 000 01019nam 2200325 a 4500

• 000 1000107415

• 001 0000329944

• 005 20090928151701.0

• 008 090928s1982 a b 000 0 eng d

• 020 __ |c CNY6.15

• 040 __ |a CAU |c CAU

• 090 __ |a O213.2/DW

• 093 __ |a O213.2 |2 4

• 100 1_ |a DuBlanica, W.

• 245 10 |a Validation of maintainability prediction / |c W.DuBlanica, J.Kubeck and E.Edwards.

• 260 __ |a [S.l. : |b s.n.], |c 1982.

• 300 __ |a 1 v. (various pagings) : |b ill. ; |c 26 cm.

• 500 __ |a "RADC-TR-82-185."

• 500 __ |a Cover title.

• 504 __ |a Includes bibliographical references.

• 513 __ |a Final technical report.

• 650 _0 |a Maintainability.

• 650 _0 |a Test facilities.Eqipment and methods.

• 700 1_ |a Kubeck, J.

• 700 1_ |a Edwards, E.

• 710 2_ |a Lockeed Electronics Co.,Inc.

• 901 __022009002097

• 905 __ |a CAU |f O213.2/DW |b E0217415

• 907 __ |a CAU |f O213.2/DW |b E0217415

• 999 __ |t A |A gxr |a 20090928 15:08:25 |I gxr |i 20090928 15:17:01 |G gxr |g 20091020 08:11:1