机读格式显示(MARC)

• 000 00585cam a2200205 a 4500

• 001 0000571203

• 005 20191003160500.0

• 008 730607s1973 jp b 00110 eng

• 010 __ |a 73009643

• 040 __ |d ICU |c PUL

• 041 1_ |a eng

• 090 __ |a TN3-53/DPI/(1979)

• 093 __ |a TN3-53 |2 5

• 099 __ |a CAL 022000284998 |a CAL 021999619903

• 245 10 |a Digest of papers IEEE 1979 semiconductor test conference.

• 260 __ |a New Jersey : |b S.J., |c 1979.

• 300 __ |a 1 V. : |b ill. ; |c 25cm.

• 650 _0 |a Semiconductor Testing Conference.

• 710 0_ |a Test technology committee

• 920 __ |a 211180 |z 1