机读格式显示(MARC)

• 000 01475cam a2200325 a 4500

• 001 0000332427

• 005 20191109095000.0

• 008 010411s19 gw a 000 0 ger d

• 020 __ |c CNY25.40 (3 v.)

• 040 __ |a SCT |c SCT

• 041 0_ |a eng |a ger

• 090 __ |a TM-65/IEC

• 093 __ |a TM-65 |2 4

• 093 __ |a TN303-65 |2 4

• 099 __ |a CAL 022001181814

• 110 2_ |a International Electrotechnical Commission.

• 245 10 |a Semiconductor devices and integrated circuits / |c International Electrotechnical Commission, ISO.

• 260 __ |a [Genève, Suisse : |b International Electrotechnical Commission, ISO, |c n.d.]

• 300 __ |a 3 v. : |b ill. ; |c 29 cm.

• 490 1_ |a Its Publication ; |v 147, 148, 191

• 500 __ |a Cover title.

• 505 1_ |a Essential ratings and characteristics of semiconductor devices and general principles of measuring methods -- Letter symbols for semiconductor devices and integrated microcircuits -- Mechanical standardization of semiconductor devices.

• 546 __ |a German and English.

• 650 _0 |a Semiconductors |x Standards.

• 650 _0 |a Integrated circuits |x Standards.

• 740 02 |a Mechanical standardization of semiconductor devices.

• 740 02 |a Essential ratings and characteristics of semiconductor devices and general principles of measuring methods.

• 740 02 |a Letter symbols for semiconductor devices and integrated microcircuits.

• 830 _0 |a Publication (International Electrotechnical Commission) ; |v 147, 191.

• 920 __ |a 211180 |z 1