机读格式显示(MARC)

• 000 01233cam 2200349 a 4500

• 000 1000104297

• 001 0000327114

• 005 20081009154518.0

• 008 960618s1975 vaua 000 0 eng

• 010 __ |a 78057209 //r852

• 020 __ |c CNY3.00

• 040 __ |a DLC |c DLC |d SCT

• 050 00 |a TK7868.D5 |b L36

• 082 00 |a 621.3819/5835

• 090 __ |a TN4/LDG/V.1

• 093 __ |a TN4 |2 4

• 099 __ |a CAL 021999623975

• 100 1_ |a Rony, Pteer R.

• 245 14 |a The bugbook I : |b logic & memory experiments using TTL integrated circuits / |c by Peter R. Rony, David G. Larsen ; with assistance by Robert A. Braden.

• 246 3_ |a Bugbook 1

• 246 3_ |a Bugbook one

• 260 __ |a Blacksburg, Virginia : |b E & L Instruments, Inc., |c 1975.

• 300 __ |a 1 v. (various pagings) : |b ill. ; |c 23 cm.

• 650 _0 |a Computer storage devices |x Experiments.

• 650 _0 |a Integrated circuits |x Experiments.

• 650 _0 |a Digital electronics |x Experiments.

• 650 _0 |a Transistor-transistor logic circuits |x Experiments.

• 700 1_ |a Larsen, David G.

• 901 __022008003032

• 905 __ |a CAU |f TN4/LDG/V.1 |b ZX003116(or.)

• 907 __ |a CAU |f TN4/LDG/V.1 |b ZX003116(or.)

• 999 __ |t C |A xy1 |a 20081007 08:19:12 |I xy1 |i 20081009 15:45:18 |G xy1 |g 20081015 16:23:0