机读格式显示(MARC)

• 000 01492cam 2200337 a 4500

• 000 1000101411

• 001 0000324570

• 005 20080117144605.0

• 008 890309s1989 dcua b 101 0 eng

• 010 __ |a 89083677

• 020 __ |a 0818659629

• 020 __ |a 0818689625 : |c CNY92.80

• 040 __ |a DLC |c DLC |d DLC

• 050 00 |a TK7874 |b .I593 1989

• 082 00 |a 620/.0044 |2 20

• 090 __ |a TN407-53/ITC/(1989)

• 093 __ |a TN407-53 |2 4

• 099 __ |a CAL 021999672843 |a CAL 022000220343 |a CAL 021999671152 |a CAL 022000886155

• 111 2_ |a International Test Conference |n (20th : |d 1989 : |c Washington, DC)

• 245 10 |a Meeting the tests of time : |b International Test Conference 1989 proceedings : August 29-31, 1989 : Sheraton Washington Hotel, Washington, DC / |c sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.

• 260 __ |a Washington : |b IEEE Computer Society Press , |c c1989.

• 300 __ |a xxxiv, 959 p. : |b ill. ; |c 29 cm.

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Integrated circuits |x Testing |v Congresses.

• 650 _0 |a Automatic checkout equipment |v Congresses.

• 710 2_ |a IEEE Computer Society. |b Test Technology Technical Committee.

• 710 2_ |a IEEE Computer Society. |b Philadelphia Chapter.

• 901 __022008000062

• 905 __ |a CAU |f TN407-53/ITC/(1989) |b E0274564

• 907 __ |a CAU |f TN407-53/ITC/(1989) |b E0274564

• 999 __ |t C |A zjyx |a 20080117 14:42:08 |I zjyx |i 20080117 14:46:05 |G gxr |g 20100123 10:04:1