机读格式显示(MARC)

• 000 00967cam 2200277 a 4500

• 000 1000099391

• 001 0000322622

• 005 20091113104823.0

• 008 770729s1958 paua 000 0 eng

• 010 __ |a 59000082

• 020 __ |c CNY1.40

• 040 __ |c NMU

• 082 __ |a 621.38151

• 090 __ |a TN1/AST

• 093 __ |a TN1 |2 4

• 094 __ |a 73.17078563/A512

• 099 __ |a CAL 022002090008

• 110 2_ |a American Society for Testing Materials. |b Committee F-1 on Materials for Electron Tubes and Semiconductor Devices.

• 245 10 |a ASTM standards on electron-tube materials : |b specifications, methods of testing.

• 260 __ |a Philadelphia : |b American Society for Testing Materials, |c 1958.

• 300 __ |a viii, 231 p. : |b ill., tables. ; |c 23 cm.

• 650 _0 |a Electron tubes |x Materials.

• 901 __022007006861

• 905 __ |a CAU |f TN1/AST |b E0234791

• 907 __ |a CAU |f TN1/AST |b E0234791

• 999 __ |t C |A zjyx |a 20071107 09:26:37 |I wzhlc |i 20091113 10:48:23 |G wzhlc |g 20091113 10:48:3