机读格式显示(MARC)

• 000 01214cam 2200289 a 4500

• 000 1000003169

• 001 0000276846

• 005 20060627140241.0

• 008 19791024s1979 nyu b 10110 eng

• 020 __ |c 2.30

• 040 __ |a CAU

• 050 0_ |a QD96.M3 |b I57 1979

• 082 __ |a 543/.08

• 090 __ |a O657.6-53/ICS/(1979)

• 093 __ |a O657.6-53 |2 4

• 111 20 |a International Conference on Secondary Ion Mass Spectrometry, |b 2d, |c Stanford University, |d 1979.

• 245 10 |a Secondary ion mass spectrometry, SIMS-II : |b proceedings of the Second International Conference on Secondary IonMassSpectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27-31, 1979 / |c editors, A. Benninghoven...[et al.].

• 260 __ |a New York : |b Springer-Verlag, |c 1979.

• 300 __ |a xiii, 298 p. : |b ill. ; |c 24 cm.

• 440 _0 |a Springer series in chemical physics ; |v 9

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Secondary ion mass spectrometry |x Congresses.

• 700 1_ |a Benninghoven, A.

• 901 __022006015849

• 905 __ |a CAU |f O657.6-53/ICS/(1979) |b 42377

• 907 __ |a CAU |f O657.6-53/ICS/(1979) |b 42377

• 999 __ |t E |A xy1 |a 20060627 14:02:06 |G unknown |g 19980101 |I xy1 |i 20060627 14:02:4