机读格式显示(MARC)

• 000 01024cam a2200241 4500

• 001 0000570244

• 005 20191001092900.0

• 008 980921s1984 mdua 10110 eng d

• 020 __ |a 0818605480

• 040 __ |c SJT

• 090 __ |a TB22-53/ITC

• 093 __ |a TB22-53 |2 5

• 099 __ |a CAL 022000318670

• 111 2_ |a International Test Conference |d (1984)

• 245 00 |a International Test Conference : |b proceedings : the three faces of test : design, characterization, production / |c sponsored by the IEEE Computer Society Test Technology Committee, IEEE Philadelphia Section.

• 260 __ |a Silver Spring, Md. : |b IEEE Computer Society Pr., |c c1984.

• 300 __ |a xxxi, 885 p. : |b ill. ; |c 28 cm.

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Integrated circuits |x Testing |x Congresses.

• 650 _0 |a Automatic checkout equipment |x Congresses.

• 710 2_ |a IEEE Computer Society. |b Test Technology Committee.

• 710 2_ |a Institute of Electrical and Electronics Engineers. |b Philadelphia Section.

• 920 __ |a 211180 |z 1