机读格式显示(MARC)

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• 000 1000102591

• 001 0000325620

• 005 20080327105954.0

• 008 981216s1982 nyua b 100 0 eng d

• 020 __ |c CNY14.40

• 040 __ |c SJT

• 050 0_ |a TK7895.A8 |b A98 1982

• 082 0_ |a 620/.0044 |2 19

• 090 __ |a TP274-53/AN/(1982)

• 093 __ |a TP274-53 |2 4

• 099 __ |a CAL 022000331620 |a CAL 022001118437

• 111 2_ |a AUTOTESTCON |d (1982 : |c Dayton, Ohio)

• 245 10 |a Autotestcon '82 : |b 1982 IEEE International Automatic Testing Conference, October 12-14, Dayton Convention Center, Dayton, Ohio / |c sponsored by the Institute of Electrical and Electronic Engineers ... [et al.].

• 246 34 |a IEEE 1982 Autotestcon

• 246 30 |a 1982 IEEE international automatic testing conference

• 260 __ |a New York, N.Y. : |b IEEE, |c c1982.

• 300 __ |a ix, 592 p. : |b ill. ; |c 28 cm.

• 500 __ |a "82CH1786-3"

• 500 __ |a Pages 591-592 blank.

• 504 __ |a Includes bibliographical references.

• 650 _0 |a Automatic checkout equipment |v Congresses.

• 710 2_ |a Institute of Electrical and Electronics Engineers.

• 901 __022008001321

• 905 __ |a CAU |f TP274-53/AN/(1982) |b E0273203

• 907 __ |a CAU |f TP274-53/AN/(1982) |b E0273203

• 999 __ |t C |A gxr |a 20080327 10:55:36 |I gxr |i 20080327 10:59:54 |G gxr |g 20100312 13:56:0