机读格式显示(MARC)

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• 000 1000102543

• 001 0000325576

• 005 20100315102021.0

• 008 861126s1987 waua b 001 0 eng

• 010 __ |a 86063732

• 020 __ |a 089252765X (pbk.) : |c CNY20.70

• 040 __ |d TJU |c SJT

• 050 0_ |a TS156.2 |b .A89 1987

• 082 0_ |a 681/.2 |2 19

• 090 __ |a TP274-53/AIM

• 093 __ |a TP274-53 |2 4

• 099 __ |a CAL 021999645395 |a CAL 022000314091 |a CAL 021999655007

• 245 10 |a Automated inspection and measurement : |b 28-30 October 1986, Cambridge, Massachusetts / |c Michael J.W. Chen, Robert Thibadeau, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Carnegie Mellon University, Sira Ltd. (United Kingdom), Tufts University/Electro-Optics Technology Center.

• 260 __ |a Bellingham, Wash., USA : |b SPIE--the International Society for Optical Engineering, |c c1987.

• 300 __ |a vi, 256 p. : |b ill. ; |c 28 cm.

• 490 0_ |a Proceedings of SPIE--the International Society for Optical Engineering ; |v v. 730

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Engineering inspection |x Automation |v Congresses.

• 650 _0 |a Quality control |x Optical methods |v Congresses.

• 700 1_ |a Chen, Michael J. W.

• 700 1_ |a Thibadeau, Robert.

• 710 2_ |a Society of Photo-optical Instrumentation Engineers.

• 901 __022008001261

• 905 __ |a CAU |f TP274-53/AIM |b E0273201

• 907 __ |a CAU |f TP274-53/AIM |b E0273201

• 999 __ |t C |A gxr |a 20080326 10:50:42 |I gxr |i 20100315 10:20:21 |G gxr |g 20100315 10:20:2