机读格式显示(MARC)

• 000 00792cam a2200193 a 4500

• 001 0000568379

• 005 20190708111000.0

• 008 190708s1974 loua b 101 0 eng

• 040 __ |a CAU |c CAU

• 090 __ |a TN153-53/EMS/(1974)

• 093 __ |a TN153-53 |2 5

• 110 2_ |a Electron Microscopy Society of America. |b Annual Meeting |n (32th : |d 1974 : |c San Francisco, Calif.)

• 245 10 |a Proceedings : |b thirty-second Annual Meeting, Electron Microscopy Society of America, St. Louis, Missouri, August 13, 14, and 15, 1974 /editor, Claude J. Arceneaux.

• 260 __ |a Baton Rouge, La. : |b Claitor's Publishing division, |c 1974.

• 300 __ |a 573 p. : |b ill. ; |c 27 cm.

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Electron microscopy.

• 700 1_ |a Arceneaux, Claude J.

• 920 __ |a 211180 |z 1