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• 000 00998cam 2200277 a 4500

• 000 1000103093

• 001 0000326083

• 005 20100105084649.0

• 008 981216s1984 nyua b 101 0 eng

• 020 __ |c CNY9.00

• 040 __ |c SJT

• 090 __ |a TP274-53/AN/(1984)

• 093 __ |a TP274-53 |2 4

• 099 __ |a CAL 022000327791

• 111 2_ |a Autotestcon'84 |d (1984 : |c Washington, DC)

• 245 10 |a Autotestcon '84 : |b proceedings, 5-7 Nov., 1984, Sheraton-Washington Hotel, Washington, DC.

• 260 __ |a New York : |b IEEE, |c c1984.

• 300 __ |a 412 p. : |b ill. ; |c 28 cm.

• 504 __ |a Includes bibliographical references and index.

• 650 __ |a Automatic checkout equipment |v Congresses.

• 650 __ |a Testing |x Data processing |v Congresses.

• 710 2_ |a Institute of Electrical and Electronics Engineers.

• 901 __022008001787

• 905 __ |a CAU |f TP274-53/AN/(1984) |b E0273221

• 907 __ |a CAU |f TP274-53/AN/(1984) |b E0273221

• 999 __ |t C |A zjyx |a 20080414 09:55:48 |I gxr |i 20100105 08:46:49 |G gxr |g 20100105 08:46:5