机读格式显示(MARC)

• 000 01288cam 2200313 a 4500

• 000 1000010591

• 001 0000283340

• 005 20080104110656.0

• 008 910525s1972 ne a b 001 0 eng

• 020 __ |a 0444104046 : |c CNY2.50

• 040 __ |a CAU |c CAU

• 050 0_ |a QH212.E4 |b P7

• 082 0_ |a 502/.8/25 |2 19

• 090 __ |a TN153/PME/V.1.

• 093 __ |a TN153 |2 4

• 099 __ |a CAL 022000331191

• 245 00 |a Practical methods in electron microscopy. |n Vol. 1 / |c edited by Audrey M. Glauert.

• 260 __ |a Amsterdam : |b North-Holland Pub. Co. ; |a New York : |b Sole distributors for the U.S.A., American ElsevierPub.Co., |c 1972.

• 300 __ |a 2 v. : |b ill. ; |c 23 cm.

• 504 __ |a Includes bibliographies and indexes.

• 505 1_ |a pt. 1. Specimen preparation in materials science / P.J. Goodhew. -- pt. 2. Electron diffraction and opticaldiffractiontechniques / B.E.P. Beeston, R.W. Horne, and R. Markham.

• 650 _0 |a Electron microscope |x Technique.

• 700 1_ |a Glauert, Audrey M.

• 740 02 |a Specimen preparation in materials science.

• 740 02 |a Electron diffraction and opticaldiffractiontechniques.

• 901 __022006001464

• 905 __ |a CAU |f TN153/PME/V.1. |b 33322

• 907 __ |a CAU |f TN153/PME/V.1. |b 33322

• 999 __ |t E |A xy1 |a 20080104 11:06:25 |G unknown |g 19980101 |I xy1 |i 20080104 11:07:0