机读格式显示(MARC)

• 000 01173cam a2200277 a 4500

• 001 0000570341

• 005 20191002104900.0

• 008 791119s1963 mdua b 000 0 eng

• 010 __ |a 63019219

• 035 __ |a (OCoLC)ocm05714534

• 040 __ |a DLC |c PMC |d OCL |d UKM |d OCL |d YUS |d WaOLN

• 090 __ |a O46/POF

• 093 __ |a O46 |2 5

• 099 __ |a CAL 022008133449

• 111 2_ |a Symposium on the Physics of Failure in Electronics |d (1962 : |c Chicago)

• 245 10 |a Physics of failure in electronics : |b [proceedings] / |c Edited by M. F. Goldberg and Joseph Vaccaro.

• 260 __ |a Baltimore : |b Spartan Books ; |a London : |b Cleaver-Hume Press, |c 1963.

• 300 __ |a 255 p. : |b ill., diagrs. ; |c 25 cm.

• 500 __ |a "Sponsored by the Applied Research Laboratory of Rome Air Development Center and the Armour Research Foundation of Illinois Institute of Technology."

• 504 __ |a Includes bibliographical references.

• 650 _0 |a Electronic apparatus and appliances |x Reliability |v Congresses.

• 700 1_ |a Goldberg, M. F.

• 700 1_ |a Vaccaro, Joseph.

• 710 2_ |a Rome Air Development Center. |b Applied Research Laboratory.

• 710 2_ |a Armour Research Foundation (U.S.)

• 920 __ |a 211180 |z 1