机读格式显示(MARC)

• 000 01059nam 22003135a 45

• 000 1000086960

• 001 0000310375

• 008 850715s1960 ne a b 100 0 eng

• 010 __ |a 60012354

• 020 __ |c CNY45.00

• 040 __ |a DLC/ICU |c ICU |d DLC

• 041 0_ |a enggerfre

• 050 00 |a QC373.X2 |b I5 1959

• 082 00 |a 537.5352

• 090 __ |a 537.535/E57

• 111 2_ |a International Symposium on X-ray Optics and X-ray Microanalysis |n (2nd : |d 1959 : |c Stockholm, Sweden)

• 245 10 |a X-ray microscopy and X-ray microanalysis / |c Edited by A. Engstrom, V. Cosslett [and] H. Pattee.

• 260 __ |a Amsterdam ; |a New York : |b Elsevier Pub. Co., |c 1960.

• 300 __ |a x, 542 p. : |b ill. ; |c 25 cm.

• 500 __ |a Papers in English, German, or French.

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a X-ray microscopy |x Congresses.

• 650 _0 |a Microradiography |x Congresses.

• 700 1_ |a Pattee, H.

• 700 1_ |a Engstrom, Arne, |e ed.

• 700 1_ |a Cosslett, V.

• 901 __HSW200701802

• 905 __ |a CAU |f 537.535/E57

• 907 __ |a CAU |f 537.535/E5