机读格式显示(MARC)
- 000 01547cam a2200337 a 4500
- 008 981214s1983 mdua b 101 0 eng d
- 020 __ |a 0818645202 (microfiche)
- 020 __ |a 0818685204 (casebound)
- 020 __ |a 0818605200 (pbk.) : |c CNY4.00
- 040 __ |a SJT |c SJT |d SCT
- 050 _4 |a TK7874 |b .C86 1983
- 082 04 |a 621.381/73/0287 |2 19
- 090 __ |a TP274-53/CTT/(1983)
- 099 __ |a CAL 022000310104
- 111 2_ |a Curriculum for Test Technology Workshop |d (1983 : |c University of Minnesota, Minneapolis)
- 245 10 |a Curriculum for test technology : |b M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 / |c IEEE Computer Society Test Technology Committee.
- 260 __ |a Silver Spring, MD : |b IEEE Computer Society Press ; |a Los Angeles, CA : |b Order from IEEE Computer Society, |c c1983.
- 300 __ |a vii, 173 p. : |b ill. ; |c 28 cm.
- 500 __ |a "IEEE catalog number 83CH1978-6."
- 500 __ |a "IEEE Computer Society order number 520."
- 500 __ |a Proceedings of the Curriculum for Test Technology Workshop.
- 500 __ |a "[Sponsored by] the Institute of Electrical and Electronics Engineers, Inc., IEEE Computer Society."
- 504 __ |a Includes bibliographical references and index.
- 650 _0 |a Integrated circuits |x Testing |v Congresses.
- 650 _0 |a Integrated circuits |x Testing |x Study and teaching |v Congresses.
- 710 2_ |a IEEE Computer Society. |b Test Technology Committee.
- 710 2_ |a IEEE Computer Society.