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• 000 1000103092

• 001 0000326082

• 005 20100105084414.0

• 008 860214s1986 nyua b 100 0 eng

• 010 __ |a 86080390

• 020 __ |c CNY13.90

• 040 __ |c EST

• 050 0_ |a TK7895.A8 |b A98 1986

• 082 0_ |a 621.381/028/7 |2 19

• 090 __ |a TP274-53/AN/(1986)

• 093 __ |a TP274-53 |2 4

• 099 __ |a CAL 021999664418

• 111 2_ |a Autotestcon'86 |d (1986 : |c San Antonio, Tex.)

• 245 10 |a Proceedings : |b Autotestcon 86, San Antonio, TX, September 8-11, 1986, IEEE International Automatic Testing Conference, Henry B. Gonzalez Convention Center, San Antonio, Texas / |c sponsored by the Institute of Electrical and Electronics Engineers ... [et al.].

• 246 34 |a Autotestcon 86

• 260 __ |a New York, NY : |b IEEE ; |a Piscataway, NJ : |b Copies from Order Dept., IEEE, |c c1986.

• 300 __ |a xiii, 415 p. : |b ill. ; |c 28 cm.

• 500 __ |a Cover title: Autotestcon 86.

• 500 __ |a "86CH2299-6."

• 504 __ |a Includes bibliographical references.

• 650 _0 |a Automatic checkout equipment |v Congresses.

• 710 2_ |a Institute of Electrical and Electronics Engineers.

• 901 __022008001786

• 905 __ |a CAU |f TP274-53/AN/(1986) |b E0273217-18

• 907 __ |a CAU |f TP274-53/AN/(1986) |b E0273217-18

• 999 __ |t C |A zjyx |a 20080414 09:50:38 |I gxr |i 20100105 08:44:14 |G gxr |g 20100105 08:45:2