机读格式显示(MARC)

• 000 00778cam a2200205 a 4500

• 001 0000565866

• 005 20190617150900.0

• 008 940210s1982 dcua 101 0 eng d

• 040 __ |a CAU |c CAU

• 090 __ |a TN153-53/EMS/(1982)

• 093 __ |a TN153-53 |2 5

• 099 __ |a CAL 022000878097

• 111 2_ |a Annual Meeting Electron Microscopy Society of American |n (40th. : |d 1982 |c Washington, D.C.)

• 245 10 |a Proceedings fortieth annual meeting Electron Microscopy Society of America, Washington, D.C., August 9-13, 1982 / |c editor G.W. Bailey.

• 260 __ |a Baton Rouge : |b Claitor's, |c 1982.

• 300 __ |a [26] 757 p. : |b ill ; |c 27 cm.

• 504 __ |a Includes bibliographical references and author index

• 650 _0 |a Electron microscopy |x Congresses.

• 700 1_ |a Bailey, G. W.

• 920 __ |a 211180 |z 1