机读格式显示(MARC)

• 000 01730cam 2200397 a 4500

• 000 1000004263

• 001 0000277852

• 005 20060619142422.0

• 008 820102s1980 ne a b 000 0 eng

• 020 __ |z 0909000145 (set)

• 020 __ |z 0909000145 (set) etc.

• 020 __ |a 9090001468

• 020 __ |a 9090001476

• 020 __ |a 9090001484

• 020 __ |a 9090001492

• 040 __ |a CAU

• 050 0_ |a QH212.E4 |b E97 1980

• 082 0_ |a 502/.8/25 |2 19

• 090 __ |a TH742-53/ECE/(1980)

• 093 __ |a TH742-53 |2 4

• 099 __ |a CAL 022000380378 |a CAL 022000815126

• 111 20 |a European Congress on Electron Microscopy |n (7th : |d 1980 : |c Hague, Netherlands)

• 245 10 |a Electron microscopy, 1980 : |b proceedings of the Seventh European Congress on Electron Microscopy, The Hague,TheNetherlands, August 24-29, 1980.

• 260 __ |a Leiden : |b Seventh European Congress on Electron Microscopy Foundation, |c 1980.

• 300 __ |a 4 v. : |b ill. ; |c 27 cm.

• 500 __ |a Incorporated the Ninth International Conference on X-ray Optics and Microanalysis.

• 500 __ |a Editors, P. Brederoo ... et al.

• 504 __ |a Includes bibliographical references and index.

• 505 0_ |a v. 1. Physics. -- 565 p. -- v. 2. Biology. -- 837 p. -- v. 3. Analysis. -- 253 p. -- v. 4. High voltage. -- 423 p.

• 650 _0 |a Electron microscopy |x Congresses.

• 700 1_ |a Brederoo, P.

• 711 20 |a International Conference on X-ray Optics and Microanalysis |n (9th : |d 1980 : |c Hague, Netherlands)

• 901 __022006001495

• 905 __ |a CAU |f TH742-53/ECE/(1980) |b 48561v.1: |b 48401v.2: |b 47082v.3: |b 46820v.4:

• 907 __ |a CAU |f TH742-53/ECE/(1980) |b 48561v.1: |b 48401v.2: |b 47082v.3: |b 46820v.4:

• 999 __ |t E |A xy1 |a 20060619 14:24:08 |G unknown |g 19980101 |I xy1 |i 20060619 14:24:2