机读格式显示(MARC)

• 000 01355cam 2200313 a 4500

• 000 1000003502

• 001 0000277166

• 005 20060619112111.0

• 008 19800709s1980 enka b 10100 eng

• 020 __ |a 0854981438 : |c ?1.00

• 040 __ |a CAU

• 050 0_ |a QH212.E4 |b E379

• 082 0_ |a 502/.8/25 |2 19

• 090 __ |a TN153-53/IPE/(1979)

• 099 __ |a CAL 022000380378 |a CAL 022000815126

• 245 00 |a Electron microscopy and analysis, 1979 : |b proceedings of the Institute of Physics Electron Microscopy and AnalysisGroupconference held at the University of Sussex, Brighton, 3-6 September 1979 (EMAG 79) / |c edited by T. Mulvey.

• 260 __ |a Bristol : |b Institute of Physics, |c 1980.

• 300 __ |a xv, 472 p. : |b ill. ; |c 24 cm.

• 490 1_ |a Conference series - Institute of Physics ; no. 52 |x 0305-2346

• 504 __ |a Includes bibliographical references and indexes.

• 650 _0 |a Microprobe analysis |x Congresses.

• 650 _0 |a Electron microscopy |x Congresses.

• 700 1_ |a Mulvey, T.

• 710 20 |a Institute of Physics (Great Britain). |b Electron Microscopy and Analysis Group.

• 830 _0 |a Conference series (Institute of Physics (Great Britain)) ; |v no. 52.

• 901 __022006013791

• 905 __ |a CAU |f TN153-53/IPE/(1979) |b 44599

• 907 __ |a CAU |f TN153-53/IPE/(1979) |b 44599

• 999 __ |t E |A xy1 |a 20060619 11:21:00 |G unknown |g 19980101 |I xy1 |i 20060619 11:21:1