机读格式显示(MARC)

• 000 01213cam 2200301 a 4500

• 000 1000099969

• 001 0000323187

• 005 20080327144741.0

• 008 850807s1958 paua b 000 0 eng d

• 020 __ |c CNY0.85

• 040 __ |a C |c C |d CStRLIN

• 090 __ |a TG113-53/SAE/(1958)

• 093 __ |a TG113-53 |2 4

• 094 __ |a 75.1/S989b

• 099 __ |a CAL 022003116784

• 111 2_ |a Symposium on Advances in Electron Metallography |n (61st : |d 1958 : |c Boston)

• 245 10 |a Symposium on advances in electron metallography, presented at the sixty-first annual meeting, Boston, Mass., June 24, 1958 / |c American Society for Testing Materials.

• 260 __ |a Philadelphia : |b American Society for Testing Materials, |c c1958.

• 300 __ |a 120 p. : |b ill. ; |c 24 cm.

• 440 _0 |a American Society for Testing Materials. |v no.245

• 504 __ |a Includes bibliographical references.

• 650 _0 |a Metallography |v Congresses.

• 650 _0 |a Electron microscopes |v Congresses.

• 710 2_ |a American Society for Testing Materials.

• 901 __022007007519

• 905 __ |a CAU |f TG113-53/SAE/(1958) |b E0234261

• 907 __ |a CAU |f TG113-53/SAE/(1958) |b E0234261

• 999 __ |t C |A gxr |a 20071123 10:09:44 |I wzhlc |i 20080327 14:47:41 |G wzhlc |g 20080327 14:48:1