机读格式显示(MARC)

• 000 01268cam 2200301 a 4500

• 000 1000083252

• 001 0000306904

• 005 20070522162928.0

• 008 980915s1981 enka b 101 0 eng d

• 020 __ |a 0904999904 (session 3) : |c CNY3.00

• 040 __ |a BUPTL |c BUPTL

• 090 __ |a TP274-53/MCC/V.3

• 093 __ |a TP274-53 |2 4

• 099 __ |a CAL 021999652325

• 110 2_ |a Metropole Covention Centre |d (1981 : |c Brighton, England)

• 245 10 |a Automatic testing 81 & test instrumentaion. |n Session 3, |p General applications and ate philosophy / |c supported by the IERE, the IQA, the Society of Test Engineers and the Journals TEST and NEW ELECTRONICS.

• 246 30 |a Automatic testing 81 and test instrumentaion

• 260 __ |a Buckingham, Bucks, UK : |b Network, |c c1981.

• 300 __ |a 106 p. : |b ill. ; |c 28 cm.

• 500 __ |a A joint IERE/NETWORK conference.

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Automatic checkout equipment |v Congresses.

• 710 2_ |a Institution of Electronic and Radio Engineers.

• 710 2_ |a NETWORK (Organization)

• 901 __022007001957

• 905 __ |a CAU |f TP274-53/MCC/V.3 |b E0233146

• 907 __ |a CAU |f TP274-53/MCC/V.3 |b E0233146

• 999 __ |t C |A gypx |a 20070424 09:18:04 |I gypx |i 20070522 16:29:28 |G wzhlc |g 20070613 16:32:4