机读格式显示(MARC)

• 000 01422cam 2200349 a 4500

• 000 1000099970

• 001 0000323188

• 005 20080327145535.0

• 008 760720s1960 paua b 100 0 eng

• 010 __ |a 59015659

• 020 __ |c CNY0.95

• 040 __ |a DLC |c WSU |d m.c. |d m/c |d CLU

• 050 __ |a TN690 |b .A62

• 090 __ |a TG113-53/AST/(1959)

• 093 __ |a TG113-53 |2 4

• 094 __ |a 75.1/S989

• 099 __ |a CAL 022003116785

• 110 2_ |a American Society for Testing Materials. |b Committee E-4 on Metallography.

• 245 10 |a Symposium on electron metallography : |b Presented at the sixty-second annual meeting, American Society for Testing Materials, Atlantic City, N. J., June 23, 1959.

• 246 30 |a Electron metallography

• 260 __ |a Philadelphia : |b American Society for Testing Materials, |c 1960.

• 300 __ |a 128 p. : |b ill. ; |c 24 cm.

• 440 _0 |a ASTM special technical publication ; |v no. 262

• 500 __ |a "Sponsored by Subcommittee XI on Electron Microstructure of Metals."

• 504 __ |a Includes bibliographical references.

• 650 _0 |a Metallography |v Congresses.

• 650 _0 |a Electron microscopes |v Congresses.

• 711 2_ |a Symposium on electron metallography |n (62nd : |d 1959 : |c Atlantic City)

• 901 __022007007520

• 905 __ |a CAU |f TG113-53/AST/(1959) |b E0234259

• 907 __ |a CAU |f TG113-53/AST/(1959) |b E0234259

• 999 __ |t C |A gxr |a 20071123 10:16:42 |I wzhlc |i 20080327 14:55:35 |G wzhlc |g 20080327 14:56:2