机读格式显示(MARC)

• 000 01416cam 2200313 a 4500

• 000 1000099832

• 001 0000323053

• 005 20071120155550.0

• 008 970624s1985 caua b 101 0 eng d

• 020 __ |c CNY3.00

• 040 __ |a SJT |c SJT |d SCT

• 090 __ |a TN06-53/IST/(1985)

• 093 __ |a TN06-53 |2 4

• 099 __ |a CAL 022000305743

• 111 2_ |a International Symposium for Testing and Failure Analysis |d (1985 : |c Long Beach, Calif.)

• 245 10 |a ISTFA 1985 : |b proceedings : International Symposium for Testing and Failure Analysis, 1985, 21-23 Oct., 1985, Hotel Queen Mary, Long Beach, Calif., U.S.A.

• 246 18 |a International Symposium for Testing & Failure Analysis 1985

• 246 14 |a International Symposium for Testing and Failure Analysis ISTFA 1985

• 260 __ |a Torrance, Calif. : |b ATFA, |c c1985.

• 300 __ |a xiv, 393 p. : |b ill. ; |c 29 cm.

• 500 __ |a "Dedicated to education and the advancement of techniques for failure analysis screening techniques product evaluation diagnostics testing."

• 500 __ |a "Covering electronics and structures."

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Testing |v Congresses.

• 650 _0 |a Reliability (Engineering) |v Congresses.

• 901 __022007007352

• 905 __ |a CAU |f TN06-53/IST/(1985) |b E0231918

• 907 __ |a CAU |f TN06-53/IST/(1985) |b E0231918

• 999 __ |t C |A gxr |a 20071120 15:39:07 |I gxr |i 20071120 15:55:50 |G gxr |g 20100930 10:31:4