机读格式显示(MARC)

• 000 00858cam a2200265 a 4500

• 001 0000572677

• 003 CAL

• 005 20190729111200.0

• 008 761108s1975 enka b 001 0 eng

• 010 __ |a 76376200 //r87

• 015 __ |a GB76-02306

• 020 __ |a 0333187032 (pbk.)

• 020 __ |a 0333154959 (hbk.)

• 040 __ |a DLC |c DLC |d DLC |d SCT

• 090 __ |a TB302.1/BDK

• 093 __ |a TB302.1 |2 3

• 099 __ |a CAL 022000376540 |a CAL 022000330643

• 100 1_ |a Bowen, D. Keith |q (David Keith), |d 1940-

• 245 10 |a Microscopy of materials : |b modern imaging methods using electron, x-ray and ion beams / |c D.K. Bowen, C.R. Hall.

• 260 __ |a London : |b MacMillan, |c 1975.

• 300 __ |a ix, 304 p. : |b ill. ; |c 23 cm.

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Materials |x Microscopy.

• 700 1_ |a Hall, Christopher Roxby.

• 920 __ |a 211180 |z 1