机读格式显示(MARC)

• 000 01411cam 2200325 a 4500

• 000 1000101730

• 001 0000324857

• 005 20110301095411.0

• 008 811217s1980 caua b 101 0 eng

• 010 __ |a 80083501

• 020 __ |c CNY8.40

• 040 __ |c WUL

• 050 0_ |a TK7874 |b .T45 1980

• 082 0_ |a 621.381/73/0287 |2 19

• 090 __ |a TM93-53/TC/(1980)

• 093 __ |a TM93-53 |2 4

• 099 __ |a CAL 022000383351

• 111 2_ |a Test Conference |n (11th : |d 1980 : |c Philadelphia, Pa.)

• 245 10 |a Testing for the 80's : |b digest of papers, 1980 Test Conference, November 11, 12, 13, 1980 / |c sponsored by IEEE Computer Society, Test Technology Committee [and] Philadelphia Section of the IEEE.

• 260 __ |a New York, N.Y. : |b Institute of Electrical and Electronics Engineers ; |a Long Beach, Calif. : |b available from IEEE Computer Society Publications Office, |c c1980.

• 300 __ |a xv, 507 p. : |b ill. ; |c 28 cm.

• 500 __ |a "80CH1608-9."

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Integrated circuits |x Testing |v Congresses.

• 710 2_ |a Institute of Electrical and Electronics Engineers. |b Philadelphia Section.

• 710 2_ |a IEEE Computer Society. |b Test Technology Committee.

• 901 __022008000376

• 905 __ |a CAU |f TM93-53/TC/(1980) |b E0274749

• 907 __ |a CAU |f TM93-53/TC/(1980) |b E0274749

• 999 __ |t C |A zjyx |a 20080229 10:11:39 |I gxr |i 20110301 09:54:11 |G gxr |g 20110301 09:54:1