机读格式显示(MARC)

• 000 00819cam a2200217 a 4500

• 001 0000580748

• 005 20191026152100.0

• 008 030414s1989 nyuac b 100 0 eng

• 010 __ |a 88080180

• 040 __ |d SCT |c NKL

• 090 __ |a TP274-53/AN/(1989)

• 093 __ |a TP274-53 |2 4

• 099 __ |a CAL 021999625710

• 111 2_ |a Autotestcon '89 |d (1989 : |c Philadelphia)

• 245 10 |a Autotestcon '89 : |b conference record : IEEE International Automatic Testing Conference / |c sponsored by the Institute of Electrical and Electronics Engineers ... [et al.].

• 260 __ |a New York : |b IEEE, |c c1989.

• 300 __ |a 357 p. : |b ill., ports. ; |c 29 cm.

• 504 __ |a Includes bibliographical references.

• 650 _0 |a Automatic checkout equipment |v Congresses.

• 710 2_ |a Institute of Electrical and Electronics Engineers.

• 920 __ |a 211180 |z 1