机读格式显示(MARC)

• 000 01041nam 22002895a 45

• 000 1000092906

• 001 0000316318

• 008 770729s1958 nyua b 100 0 eng d

• 010 __ |a 57010137

• 020 __ |c CNY1.60

• 040 __ |a DLC |c OCP |d CWR |d m.c

• 050 00 |a TK7872.T73 |b U5 1956

• 082 00 |a 621.38 |a 621.34*

• 090 __ |a 621.34/T687

• 093 __ |a TN3-532 |2 4

• 094 __ |a 73.67/P963b

• 099 __ |a CAL 022003127983

• 110 2_ |a United States. |b Advisory Group on Electron Tubes.

• 245 10 |a Proceedings of the transistor reliability symposium / |c Sponsored by the Working Group on Semiconductor Devices of the Advisory Group on Electron Tubes, Office of the Assistant Secretary of Defense, Research and Engineering.

• 260 __ |a New York : |b New York University Press, |c 1958.

• 300 __ |a 128 p. : |b ill. ; |c 28 cm.

• 504 __ |a Includes bibliographical references.

• 650 _0 |a Transistors |x Congresses.

• 740 0_ |a Transistor reliability symposium.

• 901 __HSW200707748

• 905 __ |a CAU |f 621.34/T687

• 907 __ |a CAU |f 621.34/T68