机读格式显示(MARC)

• 000 00775nam a2200253 a 4500

• 001 0000569705

• 003 CAL

• 005 20190722100600.0

• 008 851114s1986 nyua b 001 0 eng d

• 010 __ |a 85028261

• 020 __ |a 0306421402

• 035 __ |a 3740445

• 040 __ |a NLM |c NLM |d OSU

• 090 __ |a TN16/ACE

• 093 __ |a TN16 |2 3

• 099 __ |a CAL 021999653439 |a CAL 022000306872

• 245 00 |a Advanced scanning electron microscopy and X-ray microanalysis / |c Dale Newbury ... [et al.]

• 260 __ |a New York : |b Plenum Press, |c c1986.

• 300 __ |a xii, 454 p. : |b ill. ; |c 23 cm.

• 504 __ |a Includes bibliographical references (p. 435-448) and index.

• 650 _0 |a Scanning electron microscopes.

• 650 _0 |a X-ray microanalysis.

• 700 1_ |a Newbury, Dale E.

• 920 __ |a 211180 |z 1