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• 000 01470cam 2200325 a 4500

• 000 1000099833

• 001 0000323054

• 005 20071120155437.0

• 008 970624s1984 caua b 101 0 eng d

• 020 __ |c CNY3.00

• 040 __ |d SCT |c SJT

• 090 __ |a TN06-53/IST/(1984)

• 093 __ |a TN06-53 |2 4

• 099 __ |a CAL 022000305742

• 111 2_ |a International Symposium for Testing and Failure Analysis |d (1984 : |c Los Angeles, Calif.)

• 245 10 |a ISTFA 1984 : |b proceedings : International Symposium for Testing and Failure Analysis, 1984, 22-24 October 1984, Los Angeles Marriott Hotel, Los Angeles, California, U.S.A.

• 246 18 |a International symposium for testing & failure analysis 1984

• 246 30 |a Testing and failure analysis

• 246 14 |a International symposium for testing and failure analysis ISTFA 1984

• 260 __ |a Torrance, Calif. : |b ATFA, |c c1984.

• 300 __ |a xiv, 336 p. |b ill. ; |c 28 cm.

• 500 __ |a "dedicated to education and the advancement of techniques for failure analysis screening techniques product evaluation diagnostics testing"

• 500 __ |a "Covering electronics and structures."

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Testing |v Congresses.

• 650 _0 |a Reliability (Enginering) |v Congresses.

• 901 __022007007353

• 905 __ |a CAU |f TN06-53/IST/(1984) |b E0231919

• 907 __ |a CAU |f TN06-53/IST/(1984) |b E0231919

• 999 __ |t C |A gxr |a 20071120 15:49:59 |I gxr |i 20071120 15:54:37 |G gxr |g 20100930 10:31:5