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• 000 01190nam 2200277 a 4500

• 000 1000102535

• 001 0000325569

• 005 20080326104459.0

• 008 080326s1980 enka b 101 0 eng d

• 020 __ |a 0904999807 (session 3) : |c CNY2.40

• 040 __ |a CAU |c CAU

• 090 __ |a TP274-53/ATP/V.3

• 093 __ |a TP274-53 |2 4

• 245 00 |a Automatic testing 80 : |b proceedings of AUTOMATIC TESTING '80 Conference, 23-25 September 1980. |. Session 3, |p Future trends and software / |c supported by the IERE, the IQA, the IEE, the Society of Test Engineers and the Journals TEST and NEW ELECTRONICS.

• 246 30 |a Future trends and software

• 260 __ |a Buckingham, Bucks, England : |b Network, |c 1980.

• 300 __ |a 152 p. : |b ill. ; |c 28 cm.

• 500 __ |a A joint IERE/NETWORK conference.

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Automatic checkout equipment |v Congresses.

• 710 2_ |a Instituteion of Electronic and Radio Engineers.

• 710 2_ |a NETWORK (Organization).

• 901 __022008001253

• 905 __ |a CAU |f TP274-53/ATP/V.3 |b E0273200

• 907 __ |a CAU |f TP274-53/ATP/V.3 |b E0273200

• 999 __ |t C |A gxr |a 20080326 10:37:03 |I gxr |i 20080326 10:44:59 |G gxr |g 20100315 10:15:5